Trends in automated visual inspection

被引:29
|
作者
Shirvaikar, Mukul [1 ]
机构
[1] Univ Texas Tyler, Dept Elect Engn, Tyler, TX 75799 USA
关键词
Inspection System; Defect Classification; Quality Control Scheme; Smart Camera; Human Inspection;
D O I
10.1007/s11554-006-0009-6
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
[No abstract available]
引用
收藏
页码:41 / 43
页数:3
相关论文
共 50 条
  • [31] Evaluation of imaging in automated visual web inspection
    Laitinen, Jyrki
    VTT Publications, (370):
  • [32] Automated Visual Inspection of Moving Custom Parts
    Davrajh, Shaniel
    Naidoo, Thegaran
    Bright, Glen
    Tlale, N. S.
    Kumile, C. M.
    2008 15TH INTERNATIONAL CONFERENCE ON MECHATRONICS AND MACHINE VISION IN PRACTICE (M2VIP), 2008, : 227 - +
  • [33] Automated visual inspection for polished stone manufacture
    Smith, M
    Smith, L
    MACHINE VISION APPLICATIONS IN INDUSTRIAL INSPECTION XI, 2003, 5011 : 297 - 306
  • [34] Automated visual inspection of rolled metal surfaces
    Piironen, Timo
    Silven, Olli
    Pietikainen, Matti
    Laitinen, Toni
    Strommer, Esko
    Machine Vision and Applications, 1990, 3 (04) : 247 - 254
  • [35] Automated visual inspection for surface profile tolerancing
    Lau, KH
    Ng, KC
    PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART B-JOURNAL OF ENGINEERING MANUFACTURE, 1999, 213 (06) : 587 - 596
  • [36] DATA FLOW PROCESSORS FOR AUTOMATED VISUAL INSPECTION
    LECORDIER, R
    MARTIN, P
    MICROPROCESSING AND MICROPROGRAMMING, 1992, 34 (1-5): : 37 - 40
  • [37] Anode Butts Automated Visual Inspection System
    Gagne, Jean-Pierre
    Thibault, Marc-Andre
    Dufour, Gilles
    Gauthier, Claude
    Gendron, Michel
    Vaillancourt, Marie-Claude
    LIGHT METALS 2008, 2008, : 895 - +
  • [38] Automated visual inspection of magnetic disk media
    Hepplewhite, L
    Stonham, TJ
    Glover, RJ
    ICECS 96 - PROCEEDINGS OF THE THIRD IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS, AND SYSTEMS, VOLS 1 AND 2, 1996, : 732 - 735
  • [39] PROCESS CAPABILITY OF AUTOMATED VISUAL INSPECTION SYSTEMS
    GRIFFIN, PM
    VILLALOBOS, JR
    IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS, 1992, 22 (03): : 441 - 448
  • [40] Automated defect classification in VLSI visual inspection
    Hennessey, K
    Kinikoglu, P
    Lu, HT
    ICEMI'99: FOURTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, VOLS 1 AND 2, CONFERENCE PROCEEDINGS, 1999, : 657 - 662