Paracrystallites found in evaporated amorphous tetrahedral semiconductors

被引:144
作者
Treacy, MMJ
Gibson, JM
Keblinski, PJ
机构
[1] NEC Res Inst Inc, Princeton, NJ 08540 USA
[2] Univ Illinois, Dept Phys, Urbana, IL 61801 USA
[3] Univ Illinois, Dept Mat Sci, Urbana, IL 61801 USA
[4] Argonne Natl Labs, Argonne, IL 60439 USA
关键词
D O I
10.1016/S0022-3093(98)00371-8
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Variable coherence microscopy shows that as-deposited amorphous germanium and silicon contain medium-range order. The ordering can be explained by a fine-grained paracrystallite material in which intergranular stress has been relaxed by deformation. On annealing, the paracrystallite structure transforms towards the lower-energy continuous random network (CRN). We present data on a variety of vacuum-evaporated samples, and on molecular dynamics simulations of candidate structures. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:99 / 110
页数:12
相关论文
共 31 条
[21]   SUBMICROCRYSTALLITES AND THE ORIENTATIONAL PROXIMITY EFFECT [J].
OURMAZD, A ;
BEAN, JC ;
PHILLIPS, JC .
PHYSICAL REVIEW LETTERS, 1985, 55 (15) :1599-1601
[22]   TOPOLOGY OF COVALENT NON-CRYSTALLINE SOLIDS .1. SHORT-RANGE ORDER IN CHALCOGENIDE ALLOYS [J].
PHILLIPS, JC .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 34 (02) :153-181
[23]   STRUCTURE OF AMORPHOUS SI AND GE [J].
RUDEE, ML ;
HOWIE, A .
PHILOSOPHICAL MAGAZINE, 1972, 25 (04) :1001-&
[24]   STRUCTURAL AND OPTICAL-PROPERTIES OF AMORPHOUS-GERMANIUM - AMORPHOUS-GERMANIUM .2. STRUCTURAL-PROPERTIES [J].
TEMKIN, RJ ;
PAUL, W ;
CONNELL, GAN .
ADVANCES IN PHYSICS, 1973, 22 (05) :581-641
[25]   MELTING TEMPERATURE AND EXPLOSIVE CRYSTALLIZATION OF AMORPHOUS-SILICON DURING PULSED LASER IRRADIATION [J].
THOMPSON, MO ;
GALVIN, GJ ;
MAYER, JW ;
PEERCY, PS ;
POATE, JM ;
JACOBSON, DC ;
CULLIS, AG ;
CHEW, NG .
PHYSICAL REVIEW LETTERS, 1984, 52 (26) :2360-2363
[26]   Variable coherence microscopy: A rich source of structural information from disordered materials [J].
Treacy, MMJ ;
Gibson, JM .
ACTA CRYSTALLOGRAPHICA SECTION A, 1996, 52 :212-220
[27]   COHERENCE AND MULTIPLE-SCATTERING IN Z-CONTRAST IMAGES [J].
TREACY, MMJ ;
GIBSON, JM .
ULTRAMICROSCOPY, 1993, 52 (01) :31-53
[28]   MEDIUM RANGE ORDER IN AMORPHOUS-SILICON AND GERMANIUM [J].
TSU, R .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1987, 97-8 :163-166
[29]  
WOOTEN F, 1987, SOLID STATE PHYS, V40, P1
[30]  
YAMAMOTO K, 1984, ULTRASONIC SPECTROSC