Interface reactions in Ta/Ni81Fe19/Ta structures and their influence on magnetic properties

被引:14
|
作者
Yu, GH [1 ]
Li, MH
Teng, J
Zhu, FW
Lai, W
机构
[1] Univ Sci & Technol Beijing, Dept Mat Phys, Beijing 100083, Peoples R China
[2] Chinese Acad Sci, Inst Phys, Beijing 100080, Peoples R China
基金
中国国家自然科学基金;
关键词
magnetic multilayers; magnetically dead layer; interface reaction; X-ray photoelectron spectroscopy;
D O I
10.1016/j.tsf.2005.02.031
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Ta/Fe-81(19), Ni81Fe19/Ta, CuNi81Fe19, and Ni81Fe19/Cu structures are commonly used in the magnetic multilayers with giant magnetoresistance. For a Ta/Ni81Fe19/Ta fundamental structure, Ta seed and Ta cap layers result in a loss of moment equivalent to a magnetically dead layer of thickness 1.6 +/- 0.2 nm. Experimental results show that a chemical reaction between Ta and Ni81Fe19 takes place at the Ta/Ni81Fe19 and Ni81Fe19/Ta interfaces. The thickness of the magnetically dead layer was significantly reduced by the insertion of a small amount of Bi in the Ta/Ni81Fe19/Ta structure (i.e. Ta/Bi/Ni81Fe19/Ta). This result indicates that Bi acts as a surfactant that can suppress the interface reaction in multilayers. For a Cu/Ni81Fe19/Cu film, permalloy layers have hardly lost their magnetic moment since interface reactions at the Cu/Ni81Fe19 interface or Ni81Fe19/Cu interface hardly occurs. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:208 / 214
页数:7
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