Sputtering of water ice by keV electrons at 60 K

被引：17

作者：

Meier, Robyn M. ^{[1
]}

Loeffler, Mark J. ^{[2
,3
]}

机构：

[1] No Arizona Univ, Dept Appl Phys & Mat Sci, Flagstaff, AZ 86011 USA

[2] No Arizona Univ, Dept Astron & Planetary Sci, 527 S Beaver St Bldg 19,Rm 209, Flagstaff, AZ 86011 USA

[3] No Arizona Univ, Ctr Mat Interfaces Res & Applicat, Flagstaff, AZ 86011 USA

来源：

SURFACE SCIENCE | 2020年 / 691卷

基金：

美国国家科学基金会;

关键词：

Electron bombardment; Sputtering; Water ice; HYDROGEN-PEROXIDE; STIMULATED PRODUCTION; H2O ICE; ION; ENERGY; TEMPERATURE; OXYGEN; O-2; SATELLITES; FILMS;

D O I：

10.1016/j.susc.2019.121509

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We have measured the sputtering yield of H2O-ice for 0.5-10 keV electrons at 60 K using microbalance gravimetry. We find that over the energy range studied Y (H2O) changes by a factor of similar to 16, indicating that there is a clear relation between Y (H2O) and S-e. The laboratory data is qualitatively consistent with previous laboratory studies involving ion irradiation of H2O-ice and the trend with energy is reasonably fit by the most recent model for electron induced sputtering of H2O-ice, although the model overestimates the yield by at least a factor of three. In addition, we show that the irradiation history of our H2O-ice samples can strongly influence the measured Y, as temporary enhancements in Y as high as a factor of six were observed, which we speculate is a result of the release of radiolytically-produced O-2 that is trapped below the surface of our H2O-ice samples.

引用

页数：7

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