Sputtering of water ice by keV electrons at 60 K

被引:16
作者
Meier, Robyn M. [1 ]
Loeffler, Mark J. [2 ,3 ]
机构
[1] No Arizona Univ, Dept Appl Phys & Mat Sci, Flagstaff, AZ 86011 USA
[2] No Arizona Univ, Dept Astron & Planetary Sci, 527 S Beaver St Bldg 19,Rm 209, Flagstaff, AZ 86011 USA
[3] No Arizona Univ, Ctr Mat Interfaces Res & Applicat, Flagstaff, AZ 86011 USA
基金
美国国家科学基金会;
关键词
Electron bombardment; Sputtering; Water ice; HYDROGEN-PEROXIDE; STIMULATED PRODUCTION; H2O ICE; ION; ENERGY; TEMPERATURE; OXYGEN; O-2; SATELLITES; FILMS;
D O I
10.1016/j.susc.2019.121509
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We have measured the sputtering yield of H2O-ice for 0.5-10 keV electrons at 60 K using microbalance gravimetry. We find that over the energy range studied Y (H2O) changes by a factor of similar to 16, indicating that there is a clear relation between Y (H2O) and S-e. The laboratory data is qualitatively consistent with previous laboratory studies involving ion irradiation of H2O-ice and the trend with energy is reasonably fit by the most recent model for electron induced sputtering of H2O-ice, although the model overestimates the yield by at least a factor of three. In addition, we show that the irradiation history of our H2O-ice samples can strongly influence the measured Y, as temporary enhancements in Y as high as a factor of six were observed, which we speculate is a result of the release of radiolytically-produced O-2 that is trapped below the surface of our H2O-ice samples.
引用
收藏
页数:7
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