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Sputtering of water ice by keV electrons at 60 K
被引:16
作者:
Meier, Robyn M.
[1
]
Loeffler, Mark J.
[2
,3
]
机构:
[1] No Arizona Univ, Dept Appl Phys & Mat Sci, Flagstaff, AZ 86011 USA
[2] No Arizona Univ, Dept Astron & Planetary Sci, 527 S Beaver St Bldg 19,Rm 209, Flagstaff, AZ 86011 USA
[3] No Arizona Univ, Ctr Mat Interfaces Res & Applicat, Flagstaff, AZ 86011 USA
来源:
基金:
美国国家科学基金会;
关键词:
Electron bombardment;
Sputtering;
Water ice;
HYDROGEN-PEROXIDE;
STIMULATED PRODUCTION;
H2O ICE;
ION;
ENERGY;
TEMPERATURE;
OXYGEN;
O-2;
SATELLITES;
FILMS;
D O I:
10.1016/j.susc.2019.121509
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
We have measured the sputtering yield of H2O-ice for 0.5-10 keV electrons at 60 K using microbalance gravimetry. We find that over the energy range studied Y (H2O) changes by a factor of similar to 16, indicating that there is a clear relation between Y (H2O) and S-e. The laboratory data is qualitatively consistent with previous laboratory studies involving ion irradiation of H2O-ice and the trend with energy is reasonably fit by the most recent model for electron induced sputtering of H2O-ice, although the model overestimates the yield by at least a factor of three. In addition, we show that the irradiation history of our H2O-ice samples can strongly influence the measured Y, as temporary enhancements in Y as high as a factor of six were observed, which we speculate is a result of the release of radiolytically-produced O-2 that is trapped below the surface of our H2O-ice samples.
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