Influence of ZnF2 and WO3 on Radiation Attenuation Features of Oxyfluoride Tellurite WO3-ZnF2-TeO2 Glasses Using Phy-X/PSD Software

The radiation shielding features of the ternary oxyfluoride tellurite glasses were studied by calculating different shielding factors. The effect of the TeO2, WO3, and ZnF2 on the tested glass system's attenuating performance was predicted from the examination. The mass attenuation coefficient (mu/rho) values for the oxyfluoride tellurite glasses depend highly on the concentration of WO3, as well as ZnF2. All the present ZnFWTe1-ZnFWTe5 samples have higher mu/rho values than that of the pure TeO2 glass at all energies. For the samples with a fixed content of WO3, the replacement of TeO2 by ZnF2 increases the mu/rho, while for the glasses with a fixed content of TeO2, the replacement of WO3 by ZnF2 results in a decline in the mu/rho values. The results revealed that ZnFWTe4 has the lowest linear attenuation coefficient (mu) among the oxyfluoride tellurite glasses, whereby it has a slightly higher value than pure TeO2 glass. The maximum effective atomic number (Z(eff)) is found at 0.284 MeV and varied between 31.75 and 34.30 for the tested glasses; it equaled to 30.29 for the pure TeO2 glass. The half-value layer (HVL) of the glasses showed a gradual decline with increasing density. The pure TeO2 was revealed to have thicker HVL than the selected oxyfluoride tellurite glasses. A 1.901-cm thickness of the sample, ZnFWTe1, is required to decrease the intensity of a photon with an energy of 0.284 MeV to one-tenth of its original, whereas 1.936, 1.956, 2.212, and 2.079 cm are required for glasses ZnFWTe2, ZnFWTe3, ZnFWTe4, and ZnFWTe5, respectively.