Amorphous p-Type CuNiSnO Thin-Film Transistors Processed at Low Temperatures

被引:9
作者
Cheng, Xiaohan [1 ]
Lu, Bojing [1 ]
Lu, Jianguo [1 ,2 ]
Li, Siqin [1 ]
Lu, Rongkai [1 ]
Yue, Shilu [1 ]
Chen, Lingxiang [1 ]
Ye, Zhizhen [1 ]
机构
[1] Zhejiang Univ, Sch Mat Sci & Engn, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
[2] Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devic, Chengdu 610054, Peoples R China
关键词
Amorphous oxide semiconductor (AOS); p-type CuNiSnO; thin-film transistors (TFTs); OXIDE-SEMICONDUCTOR; FABRICATION;
D O I
10.1109/TED.2020.2986489
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this article, we have developed an amorphous CuNiSnO (a-CNTO), which is a p-type amorphous oxide semiconductor (AOS). The a-CNTO thin films were deposited by the pulsed laser deposition method, having high amorphous quality with a rather smooth surface. The a-CNTOfilms grown at 100 degrees C exhibited the smoothest surface (root-mean-square roughness of 0.25 nm), highest visible transparency (similar to 85%), and most favorable p-type conductivity (hole concentration of similar to 10(15) cm(-3)), which are very suitable for electronic device fabrication. Thus, the obtained p-type a-CNTO thin-film transistors (TFTs) have an ON-to-OFF current ratio of similar to 1.2 x 10(5), the threshold voltage of -2.3 V, the field-effect mobility of 1.37 cm(2)/Vs, and subthreshold swing of 0.70 V/decade. As a new kind of p-type AOS, the achievement of the p-type a-CNTO TFTs and the low-temperature processesmay open the door for practical applications in transparent and flexible electronics.
引用
收藏
页码:2336 / 2341
页数:6
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