Scanning geometry: Influencing factor on the quality of terrestrial laser scanning points

A terrestrial laser scanner measures the distance to an object surface with a precision in the order of millimeters. The quality of the individual points in a point cloud, although directly affecting standard processing steps like point cloud registration and segmentation, is still not well understood. The quality of a scan point is influenced by four major factors: instrument mechanism, atmospheric conditions, object surface properties and scan geometry. In this paper, the influence of the scan geometry on the individual point precision or local measurement noise is considered. The local scan geometry depends on the distance and the orientation of the scanned surface, relative to the position of the scanner. The local scan geometry is parameterized by two main parameters, the range, i.e. the distance from the object to the scanner and the incidence angle, i.e. the angle between incoming laser beam and the local surface normal. In this paper, it is shown that by studying the influence of the local scan geometry on the signal to noise ratio, the dependence of the measurement noise on range and incidence angle can be successfully modeled if planar surfaces are observed. The implications of this model is demonstrated further by comparing two point clouds of a small room, obtained from two different scanner positions: a center position and a corner position. The influence of incidence angle on the noise level is quantified on scans of this room, and by moving the scanner by 2 m, it is reduced by 20%. The improvement of the standard deviation is significant, going from 3.23 to 2.55 mm. It is possible to optimize measurement setups in such a way that the measurement noise due to bad scanning geometry is minimized and therefore contribute to a more efficient acquisition of point clouds of better quality. (C) 2011 International Society for Photogrammetry and Remote Sensing, Inc. (ISPRS). Published by Elsevier B.V. All rights reserved.