Challenges in Reliability Assessment for Electronics

被引:1
作者
He, Qingchuan [1 ]
Chen, Wenhua [1 ]
Pan, Jun [1 ]
Wang, Shijiao [1 ]
机构
[1] Zhejiang Sci Tech Univ, Inst Mech Design & Mfg, Hangzhou 310018, Peoples R China
来源
MATERIALS AND PRODUCT TECHNOLOGIES | 2010年 / 118-120卷
关键词
Reliability assessment; Prognostics and health management (PHM); Electronics; Systems; FMMEA; PROGNOSTICS;
D O I
10.4028/www.scientific.net/AMR.118-120.419
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
There has been a growing interest in assessing the ongoing reliability of electronics and systems in order to predict failures and provide warning to avoid catastrophic failure. Methods based on prognostics and health management shows an enabling technology to assess the reliability of electronics and systems under its actual application conditions. However, many challenges in implementation of methods based on PHM still remain including: environmental and usage profiles for life-cycle loads, identification of failure mechanism, identification of failure PoF model, identification of parameters to be monitored, approaches to anomaly detection. These challenges were presented and discussed, and would be carried out by developing methodologies and techniques.
引用
收藏
页码:419 / 423
页数:5
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