Molecular Spectroscopy Workbench Resonance Raman and Photoluminescence Spectroscopy and Imaging of Few-Layer MoS2

被引：0
作者：
Tuschel, David [1 ]
机构：
[1] Horiba Sci, Edison, NJ 08820 USA
来源：
SPECTROSCOPY | 2015年 / 30卷 / 03期
关键词：
SCATTERING; WSE2;
D O I：
暂无
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
Resonance and off-resonance Raman spectroscopy and imaging are used to examine the spatial variation of the solid-state structure and electronic character of few-layer MoS2 flakes. Simultaneous acquisition of photoluminescence spectra with the Raman scattering provides complementary ways of rendering Raman and photoluminescence spectral images of thin-film MoS2.
引用
收藏
页码：14 / 29
页数：16
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