Photopolymerization shrinkage in dimethacrylate-based dental restorative composites probed by means of positron annihilation lifetime spectroscopy

被引:9
作者
Shpotyuk, Olha [1 ]
Ingram, Adam [2 ]
Shpotyuk, Oleh [3 ,4 ]
机构
[1] Danylo Halytsky Lviv Natl Med Univ, 69 Pekarska Str, UA-79010 Lvov, Ukraine
[2] Opole Univ Technol, 75 Ozimska Str, PL-45370 Opole, Poland
[3] Jan Dlugosz Univ Czestochowa, 13-15 Armii Krajowej Str, PL-42200 Czestochowa, Poland
[4] Vlokh Inst Phys Opt, 23 Dragomanov Str, UA-79005 Lvov, Ukraine
关键词
Polymer/filler nanocomposite; Dimethacrylate; Atomic-deficient microstructure; Photopolymerization; Positron annihilation lifetime spectroscopy; FREE-VOLUME; STRUCTURAL CHARACTERISTICS; SIZE; POLYCARBONATE; DEFECTS; MICROSTRUCTURE; NANOCOMPOSITES; TEMPERATURE;
D O I
10.1016/j.polymer.2020.122485
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Peculiarities of microstructure changes in void subsystem under light-curing polymerization in loosely- and densely-packed polymer/filler nanocomposites are studied using positron annihilation lifetime (PAL) spectroscopy, at the example of commercially available dimethacrylate-based dental restorative composites Dipol (R) and (sic)CTA-3 (R). Main process governing volumetric shrinkage in these polymer/filler nanocomposites is identified as positron-to-Ps trapping conversion, initiated by fragmentation of Ps-decay holes due to crosslinking of monomer chains. Meaningful description of photopolymerization changes is developed within x3-x2-CDA (coupling decomposition algorithm). In loosely-packed nanocomposites (such as Dipol (R)), the Ps decay takes place in intrinsic holes of polymer matrix, and free positron trapping occurs in filler sub-system, specifically in the interfacial voids between filler particles themselves and filler particles contacting with surrounding polymer. Under photopolymerization, fragmentation of intrinsic holes in polymer matrix dominates over enhanced trapping of positrons in filler subsystem since filler-particles assemblies get more tightly covered by polymer owing to disappearing of interfacial free-volume voids at their surface. In densely-packed nanocomposites (such as (sic)CTA-3 (R)), where positron trapping in interfacial voids at the surface of agglomerated filler particles takes minor role, the polymerization-driven fragmentation of Ps-decay holes causes stress inside monolith filler-particles assemblies, resulting in disappearing of some interparticulate traps (positron-trapping voids between filler particles).
引用
收藏
页数:8
相关论文
共 44 条
[1]  
[Anonymous], 2016, DENT PHOTOCURED MAT
[2]  
[Anonymous], 2010, MODERN POLYM MAT ENV
[3]   Positron Annihilation Spectroscopy of Polystyrene Filled with Carbon Nanomaterials [J].
Awad, Somia ;
Chen, H. M. ;
Grady, Brian P. ;
Paul, Abhijit ;
Ford, Warren T. ;
Lee, L. James ;
Jean, Y. C. .
MACROMOLECULES, 2012, 45 (02) :933-940
[4]   Photopolymerized multifunctional (meth)acrylates as model polymers for dental applications [J].
Bland, MH ;
Peppas, NA .
BIOMATERIALS, 1996, 17 (11) :1109-1114
[5]   Positron annihilation lifetime study of extended defects in semiconductor glasses and polymers [J].
Boyko, Olha ;
Shpotyuk, Yaroslav ;
Filipecki, Jacek .
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 10, NO 1, 2013, 10 (01) :121-124
[6]   Positron annihilation studies of some anomalous features of NiFe2O4 nanocrystals grown in SiO2 -: art. no. 024115 [J].
Chakraverty, S ;
Mitra, S ;
Mandal, K ;
Nambissan, PMG ;
Chattopadhyay, S .
PHYSICAL REVIEW B, 2005, 71 (02)
[7]   Polymorphic bcc to fcc transformation of nanocrystalline niobium studied by positron annihilation [J].
Chattopadhyay, PP ;
Nambissan, PMG ;
Pabi, SK ;
Manna, I .
PHYSICAL REVIEW B, 2001, 63 (05)
[8]   Recent Advances and Developments in Composite Dental Restorative Materials [J].
Cramer, N. B. ;
Stansbury, J. W. ;
Bowman, C. N. .
JOURNAL OF DENTAL RESEARCH, 2011, 90 (04) :402-416
[9]   VACANCY-TYPE DEFECTS IN CRYSTALLINE AND AMORPHOUS SIO2 [J].
DANNEFAER, S ;
BRETAGNON, T ;
KERR, D .
JOURNAL OF APPLIED PHYSICS, 1993, 74 (02) :884-890
[10]  
Dipol, 2016, COMP UN INSTR US DIP