EBSD investigation of the microstructure and microtexture evolution of 1050 aluminum cross deformed from ECAP to plane strain compression

Electron backscattered diffraction (EBSD) was used to document the microstructure and texture developed due to cross deformation of commercial purity 1050 aluminum alloy. The materials are first deformed in equal channel angular pressing die (ECAP) to different number of passes; 1,4, 8, 12, and 16 passes, via route B-C and then deformed in plane strain compression (PSC) to two axial true plastic strain values of 0.5 and 1.0. Deformation path change was proven to be a very effective tool for manipulating the evolution of microstructure and microtexture. The study provides a documentation of the evolution of microstructure parameters namely cell size, misorientation angle, fraction of submicron grain size, and fraction of high angle grain boundaries. These microstructure parameters were investigated on two planes; the plane normal to the loading direction in PSC (RD-TD) and that plane normal to the transverse direction (RD-ND). These microstructure parameters are compared to those achieved due to the ECAP process only. The ideal rolling texture orientations are depicted and crystal orientation maps were generated. The spatial distribution of grains having these orientations is revealed through these maps. The fraction of the main texture components for a 10A degrees spread around the specified orientations is experimentally calculated and a quantitative idea on the evolution of microtexture is also presented.