Automatic test generation algorithms for analogue circuits

被引：15
作者：
Soma, M
机构：
[1] Department of Electrical Ensrineerinc, University of Washington, Box 352500, Seattle
来源：
IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS | 1996年 / 143卷 / 06期
关键词：
automatic test generation; analogue circuits;
D O I：
10.1049/ip-cds:19960898
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The author reviews the recently published automatic test generation algorithms for analogue circuits, focusing on their applicability to specific circuit classes, limitations in more general applications and possible improvements. Selected new test generation paradigms, involving design-for-test and BIST techniques, are also discussed to indicate future directions in test generation.
引用
收藏
页码：366 / 373
页数：8
相关论文
共 59 条
[21]  
KAAL V, 1996, IEEE INT MIX SIGN TE
[22]  
LEENAERTS DMW, 1993, EUR TEST C ROTT THE
[23]  
LINDERMEIR WM, 1995, IEEE INT C COMPUT AI
[24]  
LIU RW, 1987, ADV CIRCUITS SYSTEMS, P143
[25]  
MARLETT MJ, 1988, IEEE INT TEST C WASH
[26]   DETECTION OF CATASTROPHIC FAULTS IN ANALOG INTEGRATED-CIRCUITS [J].
MILOR, L ;
VISVANATHAN, V .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1989, 8 (02) :114-130
[27]   MINIMIZING PRODUCTION TEST TIME TO DETECT FAULTS IN ANALOG CIRCUITS [J].
MILOR, L ;
SANGIOVANNIVINCENTELLI, AL .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1994, 13 (06) :796-813
[28]  
MILOR L, 1990, IEEE INT C COMP AID
[29]  
MIR S, 1995, IEEE INT MIX SIGN TE
[30]   Real-time current testing for A/D converters [J].
Miura, Y .
IEEE DESIGN & TEST OF COMPUTERS, 1996, 13 (02) :34-41
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