Methods of dependent count for frequency measurements

被引：38
作者：
Kirianaki, NV [1 ]
Yurish, SY [1 ]
Shpak, NO [1 ]
机构：
[1] Inst Comp Technol, UA-290013 Lviv, Ukraine
来源：
MEASUREMENT | 2001年 / 29卷 / 01期
关键词：
frequency; quantization error; method of dependent count; microcontroller;
D O I：
10.1016/S0263-2241(00)00026-9
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The methods of dependent count for frequency (period) measurements of electrical signals are described in the article. The main formulas permitting to analyse the limiting metrological performances of some varieties of the method are reduced. The static and dynamic errors of measuring instruments based on the offered methods are researched. The examples of possible implementation and simulation results of the methodical error are given. (C) 2001 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：31 / 50
页数：20
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