CAS calculations for the ground- and excited-state properties of HSO radical

被引:0
|
作者
Li Bu-Tong
Wei Zi-Zhang
Pan Qing-Jiang
Zhang Hong-Xing [1 ]
Sun Chia-Chung
机构
[1] Jilin Univ, Inst Theoret Chem, State Key Lab Theoret & Computat Chem, Changchun 130021, Peoples R China
[2] Heilongjiang Univ, Sch Chem & Mat Sci, Harbin 150080, Peoples R China
来源
CHEMICAL JOURNAL OF CHINESE UNIVERSITIES-CHINESE | 2007年 / 28卷 / 06期
关键词
excited state; CASPT2; HSO radical;
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We optimized the structures of ground state and three low-lying excited states for HSO radical using the CASSCF method with ANO-L basis sets. Their single-point energy calculations were performed at the CASPT2 level including more electronic dynamic correlation effects. The results of frequency calculations show that these structures are minimum points on the potential energy surface. The variations of geometry parameters between the ground and excited states were rationalized by the analysis of their electronic structures. The calculated results fall well within the range of reported values.
引用
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页码:1107 / 1109
页数:3
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