Measuring the transmission matrix of a scattering medium using epi-fluorescence light

被引：2

作者：

Premillieu, Evolene ^{[1
]}

Piestun, Rafael ^{[1
]}

机构：

[1] Univ Colorado, Dept Elect Comp & Energy Engn, Boulder, CO 80309 USA

来源：

OPTICS COMMUNICATIONS | 2020年 / 462卷

基金：

美国国家科学基金会;

关键词：

MICROSCOPY;

D O I：

10.1016/j.optcom.2019.125207

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

There are several methods to focus light behind a scattering medium, but very few use fluorescence light as feedback and can be used without access to the distal side of the scatterer. Among all the wave-front shaping techniques, retrieving the transmission matrix of a scattering material is the only one that allows for focusing on multiple spots after a single set of measurements. Here we propose a method to retrieve the transmission matrix of a scatterer using fluorescence light as feedback without access to the distal side. The advantage of this method is that it allows focusing on the whole field of view after a single matrix measurement without access to the distal side of the sample, making it suitable for reflection epi-illumination geometry microscopy.

引用

页数：5

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