X-ray imaging plate using CsBr:Eu phosphors for computed radiography

被引:55
作者
Nanto, H. [1 ]
Nishimura, A.
Kuroda, M.
Takei, Y.
Nakano, Y.
Shoji, T.
Yanagita, T.
Kasai, S.
机构
[1] Kanazawa Inst Technol, Haku San, Ishikawa 9240838, Japan
[2] Konica Minoruta MG Sakura, Tokyo 1918511, Japan
关键词
X-ray imaging plated; photostimulated luminescence; CsBr : Eu; computed radiography;
D O I
10.1016/j.nima.2007.05.155
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
It is shown that X-ray-irradiated Eu-doped CsBr (CsBr:Eu) exhibits intense photostimulated luminescence (PSL). The peak wavelengths of PSL emission and stimulation spectra of CsBr:Eu phosphor ceramic samples are 450 and 690nm, respectively. The dependence of PSL properties on preparing conditions of phosphor ceramic samples, such as Eu concentration, sintering temperature and sintering time, is studied. It is found that the PSL intensity of CsBr:Eu phosphor ceramics fabricated under optimum preparation condition is higher than that of commercially available imaging plates (IP) using BaFBr:Eu and BaFI:Eu. The image quality of the IP using CsBr:Eu phosphor film is better than that of commercially available IP. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:278 / 281
页数:4
相关论文
共 7 条
[1]  
AMITANI K, 1986, 26 FALL S SPSES C EX, P180
[2]  
KAMIJO K, 2000, J NUCL SCI TECH S, V4, P365
[3]  
NAKANO Y, 2005, KONIKA MINOLTA MED N, V267
[4]   Photostimulated luminescence in insulators and semiconductors [J].
Nanto, H .
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1998, 146 (1-4) :311-321
[5]   Photostimulated luminescence process in the x-ray storage phosphor CsBr:Ga+ [J].
Rogulis, U ;
Schweizer, S ;
Assmann, S ;
Spaeth, JM .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (01) :207-211
[6]   RbBr and CsBr doped with Eu2+ as new competitive X-ray storage phosphors [J].
Schweizer, S ;
Rogulis, U ;
Assmann, S ;
Spaeth, JM .
RADIATION MEASUREMENTS, 2001, 33 (05) :483-486
[7]   PHOTOSTIMULATED LUMINESCENCE (PSL) AND COLOR-CENTERS IN BAFCL-EU-2+, BAFBR-EU-2+, BAFI-EU-2+ PHOSPHORS [J].
TAKAHASHI, K ;
MIYAHARA, J ;
SHIBAHARA, Y .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (06) :1492-1494