Enhancing primary processing for small-angle X-ray scattering

被引：2

作者：

Wei, Yanru ^{[1
,2
]}

Li, Zhihong ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, POB 918, Beijing 100049, Peoples R China

[2] Anhui Univ, Inst Hlth Sci, Hefei, Peoples R China

来源：

INSTRUMENTATION SCIENCE & TECHNOLOGY | 2017年 / 45卷 / 01期

关键词：

Detector tilt; primary data processing; program; small-angle X-ray scattering;

D O I：

10.1080/10739149.2016.1205084

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A program is reported for primary processing of small-angle X-ray scattering from various cameras. The software integrates basic functions necessary for primary processing that include instrument parameter calibration, scattering angle calibration, the conversion of a two-dimensional image to a one-dimensional curve, background and absorption subtraction, and correction for collimation effects. All instrument parameters for primary processing needs were derived with high precision by fitting a diffraction ring of a standard without the measurement of other parameters. The program is applicable whether the detector photosensitive plane is vertical or tilted with respect to the direct beam and operates easily, automatically, and rapidly on Windows computers. This article describes the structure, function, and features of the software.

引用

页码：22 / 34

页数：13

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