Electron holographic tomography for mapping the three-dimensional distribution of electrostatic potential in III-V semiconductor nanowires

被引：34

作者：

Wolf, D. ^{[1
]}

Lichte, H. ^{[1
]}

Pozzi, G. ^{[2
]}

Prete, P. ^{[3
]}

Lovergine, N. ^{[4
]}

机构：

[1] Tech Univ Dresden, Inst Struct Phys, Triebenberg Lab, D-01062 Dresden, Germany

[2] Univ Bologna, Dept Phys, I-40127 Bologna, Italy

[3] IMM CNR, Lecce Res Unit, I-73100 Lecce, Italy

[4] Univ Salento, Dipartimento Ingn Innovaz, I-73100 Lecce, Italy

来源：

APPLIED PHYSICS LETTERS | 2011年 / 98卷 / 26期

关键词：

CORE-SHELL NANOWIRES; MICROSCOPY; GROWTH;

D O I：

10.1063/1.3604793

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Electron holographic tomography (EHT), the combination of off-axis electron holography with electron tomography, is a technique, which can be applied to the quantitative 3-dimensional (3D) mapping of electrostatic potential at the nanoscale. Here, we show the results obtained in the EHT investigation of GaAs and GaAs-AlGaAs core-shell nanowires grown by Au-catalysed metalorganic vapor phase epitaxy. The unique ability of EHT of disentangling the materials mean inner potential (MIP) from the specimen projected thickness allows reconstruction of the nanowire 3D morphology and inner compositional structure as well as the measurement of the MIP. (C) 2011 American Institute of Physics. [doi:10.1063/1.3604793]

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页数：3

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