Microstresses in textured polycrystals studied by the multireflection diffraction method and self-consistent model

被引：45
|
作者：
Baczmanski, A [1 ]
Braham, C
Seiler, W
机构：
[1] Stanislaw Staszic Univ Min & Met, Fac Phys & Nucl Tech, PL-30059 Krakow, Poland
[2] Ecole Natl Super Arts & Metiers, Lab Microstruct & Mecan Mat, UMR CNRS 8006, F-75013 Paris, France
来源：
PHILOSOPHICAL MAGAZINE | 2003年 / 83卷 / 28期
关键词：
D O I：
10.1080/14786430310001604985
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A new version of the X-ray diffraction method for determining macrostresses and microstresses in textured polycrystalline material is presented. In this method the lattice strains for various orientation of the scattering vector as well as for various crystallographic planes {hkl} are measured. The interpretation of the experimental data is based on the least-squares fitting procedure, in which the diffraction elastic constants and theoretical values of microstresses are used. The diffraction elastic constants and the microstresses are calculated by the self-consistent model. The new method was successfully applied for stress determination in one- and two-phase steels subjected to elastoplastic deformation, and the significant anisotropy of the incompatibility stresses was observed in textured samples.
引用
收藏
页码：3225 / 3246
页数：22
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