HRXRD Analysis for YBa2Cu3O7-x Deposited on {001} SrTiO3

被引：0

作者：

Wang, Shuming ^{[1
]}

Zhang, Hua ^{[1
]}

Yang, Jian ^{[1
]}

Zhang, Limin ^{[1
]}

Wang, Chaoqun ^{[1
]}

机构：

[1] Gen Res Inst Nonferrous Met, Beijing 100088, Peoples R China

来源：

JOURNAL OF SUPERCONDUCTIVITY AND NOVEL MAGNETISM | 2011年 / 24卷 / 06期

关键词：

Superconductor; HRXRD; Twin domain; Phase transition; YBCO THIN-FILMS; CRITICAL CURRENTS; GRAIN-BOUNDARIES; MICROSTRUCTURE; STRAIN;

D O I：

10.1007/s10948-011-1135-3

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

YBa2Cu3O7-x (YBCO) film was deposited on {001} SrTiO3 (STO) substrate by pulse laser deposition (PLD). The microstructure of YBCO and STO was analyzed by High resolution X-ray diffraction (HRXRD). The results showed that the YBCO film alignment was C-axis coexisting with about 1 vol.% a-axis, and the spreading of YBCO's out-plane alignment is anisotropic inherited from STO's. In addition, there was 90A degrees aOE (c) 110 > twin domain with in-plane distort angle +/- 0.85A degrees distort angle in the film, which was caused by T-O phase transition.

引用

页码：1863 / 1867

页数：5

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