p-Si/DNA photoconductive diode for optical sensor applications

被引:43
作者
Gupta, R. K. [2 ]
Yakuphanoglu, F. [1 ]
Hasar, H. [3 ,4 ]
Al-Khedhairy, Abdulaziz A. [5 ]
机构
[1] Firat Univ, Dept Phys, Fac Sci, TR-23169 Elazig, Turkey
[2] Missouri State Univ, Dept Phys Astron & Mat Sci, Springfield, MO 65897 USA
[3] Firat Univ, Dept Environm Engn, TR-23169 Elazig, Turkey
[4] Firat Univ, Biotechnol Res Ctr, TR-23169 Elazig, Turkey
[5] King Saud Univ, Coll Sci, Dept Zool, Riyadh 11451, Saudi Arabia
关键词
DNA; Organic material; Photoresponse; Schottky diode; Ideality factor; HIGH SERIES RESISTANCE; ELECTRICAL-TRANSPORT; SCHOTTKY DIODES; ELECTRONIC-PROPERTIES; DNA-MOLECULES; THIN-FILMS;
D O I
10.1016/j.synthmet.2011.07.016
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The junction parameters of Al/p-Si/Ag and Al/p-Si/DNA/Ag diodes were studied using current-voltage (I-V), capacitance-voltage (C-V), and capacitance-frequency (C-f) measurements. The photoresponse properties of the diodes were analyzed using transient photocurrent measurements. The photoresponse of the Al/p-Si/DNA/Ag diode is better than that of Al/p-Si/Ag diode. The ideality factor and barrier height values of the Al/p-Si/DNA/Ag diode were obtained to be 1.2 +/- 0.1 and 0.56 +/- 0.02 eV, respectively. The capacitance of the diodes increases with decreasing frequency which is explained by the change in the interface states. These results indicate that the p-Si/DNA junction could be used as an optical sensor. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:2011 / 2016
页数:6
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