Field emission microscopy of carbon nanotube caps

被引：153
|
作者：
Dean, KA [1 ]
Chalamala, BR [1 ]
机构：
[1] Motorola Inc, Flat Panel Display Div, Tempe, AZ 85284 USA
来源：
JOURNAL OF APPLIED PHYSICS | 1999年 / 85卷 / 07期
关键词：
D O I：
10.1063/1.369753
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We report field emission microscopy images from single walled carbon nanotubes showing resolvable fine structure with five- and six-fold symmetry. We present evidence indicating that these images have atomic resolution and that they depict the electronic structure of individual nanotube caps under high-field conditions. Fine structure is observed only after removal of surface adsorbates. Prior to adsorbate removal, these images show symmetrical lobed patterns and several other behaviors characteristic of chemisorbed resonant tunneling states. (C) 1999 American Institute of Physics. [S0021-8979(99)05907-1].
引用
收藏
页码：3832 / 3836
页数：5
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