New developments in fabrication of high-energy-resolution analyzers for inelastic X-ray spectroscopy

被引：74

作者：

Said, Ayman H. ^{[1
]}

Sinn, Harald ^{[2
]}

Divan, Ralu ^{[3
]}

机构：

[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

[2] European XFEL, D-22607 Hamburg, Germany

[3] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2011年 / 18卷

关键词：

high-energy-resolution analyzers; inelastic X-ray scattering spectroscopy; SCATTERING; MONOCHROMATOR;

D O I：

10.1107/S0909049511001828

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In this work new improvements related to the fabrication of spherical bent analyzers for 1 meV energy-resolution inelastic X-ray scattering spectroscopy are presented. The new method includes the use of a two-dimensional bender to achieve the required radius of curvature for X-ray analyzers. The advantage of this method is the ability to monitor the focus during bending, which leads to higher-efficiency analyzers.

引用

页码：492 / 496

页数：5

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