Surface characterization of ultra high molecular weight polyethylene modified by swift heavy ion beam bombardment

被引:10
作者
del Grosso, M. F. [1 ]
Chappa, V. C. [1 ,2 ]
Bermudez, G. Garcia [1 ,2 ,3 ]
Forlerer, E. [4 ]
Behar, M. [5 ]
机构
[1] Comis Nacl Energia Atom, Tandar, US Fis, RA-1429 Buenos Aires, DF, Argentina
[2] Consejo Nacl Invest Cient & Tecn, Buenos Aires, DF, Argentina
[3] UNSAM, Escuela Ciencia Tecnol, RA-1653 Buenos Aires, DF, Argentina
[4] Comis Nacl Energia Atom, CAC, UA Mat, RA-1429 Buenos Aires, DF, Argentina
[5] Univ Fed Rio Grande do Sul, Inst Fis, BR-91501970 Porto Alegre, RS, Brazil
关键词
UHMWPE; swift heavy ions; ion fluence analysis; FTIR spectroscopy; unlubricated wear;
D O I
10.1016/j.surfcoat.2008.03.016
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The damage processes induced by swift heavy ions (SHI), can be very different to those induced by classical low ionising particles. This is due to the high electronic stopping power of SHI. Ultra high molecular weight polyethylene (UHMWPE) was irradiated with 6.77 MeV helium and 12.5 MeV carbon beams and fluences ranging from 10(11) to 10(13) cm(-2) and 2 x 10(10) to 5 x 10(13) cm(-2), respectively. Structural changes at the polymer near surface region were studied by means of infrared spectroscopy measurements and wear resistance tests. With FTIR spectroscopy we studied the changes in crystallinity, double bond C=C, trans-vynilene and graphite formation and the evolution of methylene group as a function of fluence. The experiments have determined that exists an optimum ion fluence value, that depends on the ion mass and energy, at which the wear resistance increases of about 85% respect to the unirradiated polymer. For helium this value is 2 x 10(12) cm(-2) and for carbon 4 x 10(11) cm(-2). At these fluence values no sign of graphite was found by FTIR studies. Using a Monte Carlo simulation program we determined that the surface area affected by the track core of the incoming ions was less than 19 and 35% for helium and carbon respectively. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:4227 / 4232
页数:6
相关论文
共 32 条
[1]   Hydrogen release in UHMWPE upon he-ion bombardment [J].
Abdul-Kader, AM ;
Turos, A ;
Jagielski, J ;
Nowicki, L ;
Ratajczak, R ;
Stonert, A ;
Al-Ma'adeed, MA .
VACUUM, 2005, 78 (2-4) :281-284
[2]   Sliding wear behaviour of ion implanted ultra high molecular weight polyethylene against a surface modified titanium alloy Ti-6Al-4V [J].
Allen, C ;
Bloyce, A ;
Bell, T .
TRIBOLOGY INTERNATIONAL, 1996, 29 (06) :527-534
[3]  
*ASTM, 2003, F221402 ASTM UHMWPE
[4]  
*ASTM, 2000, E164900 ASTM
[5]   Swift heavy ion modification of polymers [J].
Balanzat, E ;
Betz, N ;
Bouffard, S .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 105 (1-4) :46-54
[6]   PHYSICOCHEMICAL MODIFICATIONS INDUCED IN POLYMERS BY SWIFT HEAVY-IONS [J].
BALANZAT, E ;
BOUFFARD, S ;
LEMOEL, A ;
BETZ, N .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1994, 91 (1-4) :140-145
[7]   Influence of ion bombardment on tribological properties of UHMWPE [J].
Bielinski, D. M. ;
Lipinski, P. ;
Urbaniak, M. ;
Jagielski, Jacek .
TRIBOLOGY LETTERS, 2006, 23 (02) :139-143
[8]   Ion bombardment of polyethylene-influence of polymer structure [J].
Bielinski, Dariusz M. ;
Tranchida, Davide ;
Lipinski, Piotr ;
Jagielski, Jacek ;
Turos, Andrzej .
VACUUM, 2007, 81 (10) :1256-1260
[9]   Infrared spectroscopy analysis of physico-chemical modifications induced by heavy ions in ultra-high molecular weight polyethylene [J].
Chappa, VC ;
del Grosso, MF ;
García-Bermúdez, G ;
Mazzei, RO .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2006, 243 (01) :58-62
[10]   Surface modification of ion implanted ultra high molecular weight polyethylene [J].
Chen, JS ;
Zhu, FY ;
Pan, HC ;
Cao, JQ ;
Zhu, DZ ;
Xu, HJ ;
Cai, Q ;
Shen, JG ;
Chen, LH ;
He, ZR .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2000, 169 :26-30