High-resolution transmission electron microscopy of beam-sensitive halide perovskites

被引:18
作者
Yuan, Biao [1 ,2 ]
Yu, Yi [1 ,2 ]
机构
[1] ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China
[2] ShanghaiTech Univ, Shanghai Key Lab High Resolut Electron Microscopy, Shanghai 201210, Peoples R China
来源
CHEM | 2022年 / 8卷 / 02期
关键词
RADIATION-DAMAGE; RECONSTRUCTION; SPECIMENS; IMAGES; TEM;
D O I
10.1016/j.chempr.2022.01.006
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The past decade has witnessed the prosperity and development of halide perovskites from inorganic to organic-inorganic hybrid components. High-resolution transmission electron microscopy (HRTEM) characterizations of their microstructures are not keeping pace as a result of their fragile characteristics under electron-beam irradiation, hindering the in-depth excavation of the structure-property relationship. This perspective provides an overview of the effect of beam damage and the present status of low-dose imaging, as well as discusses the pitfalls in image interpretation. It then proposes a better methodology that combines dose fractionation and phase retrieval to produce interpretable images that can elucidate the intrinsic structure. The progress in halide perovskite imaging might further facilitate atomic-resolution imaging of other beamsensitive materials.
引用
收藏
页码:327 / 339
页数:13
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