On the origin of a third spectral component of C1s XPS-spectra for nc-TiC/a-C nanocomposite thin films

被引:165
作者
Lewin, E. [1 ]
Persson, P. O. A. [2 ]
Lattemann, M. [2 ]
Stueber, M. [3 ]
Gorgoi, M. [4 ]
Sandell, A. [5 ]
Ziebert, C. [3 ]
Schaedfers, F. [4 ]
Braun, W. [4 ]
Halbritter, J. [3 ]
Ulrich, S. [3 ]
Eberhardt, W. [4 ]
Hultman, L. [2 ]
Siegbahn, H. [5 ]
Svensson, S. [4 ,5 ]
Jansson, U. [1 ]
机构
[1] Uppsala Univ, Angstrom Lab, Dept Chem Mat, SE-75121 Uppsala, Sweden
[2] Linkoping Univ, Dept Phys Chem & Biol, IFM, Thin Film Phys Div, SE-58131 Linkoping, Sweden
[3] Forschungszentrum Karlsruhe, Inst Mat REs 1, D-76344 Eggenstein Leopoldshafen, Germany
[4] BESSY, D-12489 Berlin, Germany
[5] Uppsala Univ, Angstrom Lab, Dept Phys, SE-75121 Uppsala, Sweden
关键词
X-ray photoelectron spectroscopy (XPS); nanocomposite coatings; sputtering; transmission electron microscopy (TEM);
D O I
10.1016/j.surfcoat.2007.12.038
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
X-ray photoelectron spectroscopy (XPS) spectra of sputter-etched nc-TiC/a-C nanocomposite thin films published in literature show an extra feature of unknown origin;in in the C1s region. This feature is situated between the contributions of carbide and the carbon matrix. We have used high kinetic energy XPS (HIKE-XPS) on magnetron-sputtered nc-TiC/a-C thin films to show that this feature represents a third chemical environment in the nanocomposites, besides the carbide and the amorphous carbon. Our results show that component is present in as-deposited samples, and that the intensity is strongly enhanced by Ar+-ion etching. This third chemical environment may be due to interface or disorder effects. The implication, of these observations on the XPS analysis of nanocomposites are discussed in the light of overlap problems for ternary carbon based systems. (c) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:3563 / 3570
页数:8
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