Grain and crystallite size evaluation of cryomilled pure copper

被引：38

作者：

Khoshkhoo, M. Samadi ^{[1
]}

Scudino, S. ^{[1
]}

Thomas, J. ^{[1
]}

Surreddi, K. B. ^{[1
]}

Eckert, J. ^{[1
,2
]}

机构：

[1] IFW Dresden, Inst Komplexe Mat, D-01171 Dresden, Germany

[2] Tech Univ Dresden, Inst Werkstoffwissensch, D-01062 Dresden, Germany

来源：

JOURNAL OF ALLOYS AND COMPOUNDS | 2011年 / 509卷

关键词：

Nanostructured materials; Mechanical alloying; X-ray diffraction; Transmission electron microscopy; TEM; LINE-PROFILE ANALYSIS; X-RAY-DIFFRACTION; DISLOCATIONS; METALS;

D O I：

10.1016/j.jallcom.2011.02.066

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The crystallite and grain sizes of pure copper milled at cryogenic temperature for different periods have been characterized using X-ray diffraction (XRD) and transmission electron microscopy (TEM). X-ray line profile analysis using a modified Williamson-Hall method [T. Ungar, A. Revesz, A. Borbely, J. Appl. Crystallogr. 31 (1998) 554], which takes into account the strain anisotropy induced by dislocations and planar faults, was used to determine the size of the coherently scattering domains. The results reveal that the modified Williamson-Hall method leads to values that are in very good agreement with the data obtained by TEM, in particular when considering the effect of planar faults. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：S343 / S347

页数：5

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