Near-Field / Far-Field Application for a Spherical Scanner at mm-Wave Frequencies

被引：0

作者：

van Rensburg, Daniel Janse ^{[1
]}

Wynne, John ^{[1
]}

机构：

[1] NSI MI Technol, 1125 Satellite Blvd,Suite 100, Suwanee, GA 30024 USA

来源：

2018 INTERNATIONAL SYMPOSIUM ON ANTENNAS AND PROPAGATION (ISAP) | 2018年

关键词：

Spherical Near-Field; Far-Field; mm-Wave;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper describes a measurement system designed and built for measuring radiation patterns of stationary antennas at mm-Wave frequencies. The mechanical design of the system's positioner fixes the radial test distance; implying that the system can be used as either a spherical near field or far-field test system depending on the electrical size and mounting location of the radiator. For implementation of the former, our use of a spherical wave modal expansion requires the creation of a spherical surface with known sampling grid and any deviation introduces uncertainty. We show in this paper to what extent the mechanical positioner approximates an ideal spherical surface and how active angular correction of the rotary positioners allow us to correct for gravitational deformation.

引用

页数：2