Atomic Fingerprinting of Heteroatoms Using Noncontact Atomic Force Microscopy

被引:3
作者
Fan, Dingxin [1 ]
Chelikowsky, James R. [2 ]
机构
[1] Univ Texas Austin, McKetta Dept Chem Engn, POB 4-302,201 East 24th St C0200, Austin, TX 78712 USA
[2] Univ Texas Austin, McKetta Dept Chem Engn, Ctr Computat Mat, Oden Inst Computat Engn & Sci,Dept Phys, POB 4-302,201 East 24th St C0200, Austin, TX 78712 USA
关键词
atomic fingerprinting; density functional theory; heteroatoms; noncontact atomic force microscopy; organic chemistry; real space; ELECTRONIC-STRUCTURE CALCULATIONS; MOLECULE; BOND;
D O I
10.1002/smll.202102977
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Immense strides have been made in increasing the resolution of scanning probe microscopy. Noncontact atomic force microscopy (nc-AFM) now offers one the ability to characterize and visualize single molecules with subatomic resolution. Specifically, nc-AFM with a carbon monoxide (CO) functionalized tip has the ability to discriminate functional groups (-C(sic)C-, -CH2, -C(sic)O, horizontal ellipsis ), although discriminating atomic species often remains as an ongoing challenge. Here, real-space pseudopotentials constructed within density functional theory are employed to accurately simulate nc-AFM images of molecules containing heteroatoms (S, I, and N) within dibenzothiophene (DBT), 2-iodotriphenylene (ITP), acridine (ACR) and ferrous phthalocyanine (FePc). It is found that S and I atoms can be easily identified from C based on their unique features. For N atoms, a use of tip functionalization is proposed to effectively discriminate them from C atoms.
引用
收藏
页数:4
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