Atomic Fingerprinting of Heteroatoms Using Noncontact Atomic Force Microscopy
被引:2
|
作者:
Fan, Dingxin
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机构:
Univ Texas Austin, McKetta Dept Chem Engn, POB 4-302,201 East 24th St C0200, Austin, TX 78712 USAUniv Texas Austin, McKetta Dept Chem Engn, POB 4-302,201 East 24th St C0200, Austin, TX 78712 USA
Fan, Dingxin
[1
]
Chelikowsky, James R.
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机构:
Univ Texas Austin, McKetta Dept Chem Engn, Ctr Computat Mat, Oden Inst Computat Engn & Sci,Dept Phys, POB 4-302,201 East 24th St C0200, Austin, TX 78712 USAUniv Texas Austin, McKetta Dept Chem Engn, POB 4-302,201 East 24th St C0200, Austin, TX 78712 USA
Chelikowsky, James R.
[2
]
机构:
[1] Univ Texas Austin, McKetta Dept Chem Engn, POB 4-302,201 East 24th St C0200, Austin, TX 78712 USA
[2] Univ Texas Austin, McKetta Dept Chem Engn, Ctr Computat Mat, Oden Inst Computat Engn & Sci,Dept Phys, POB 4-302,201 East 24th St C0200, Austin, TX 78712 USA
atomic fingerprinting;
density functional theory;
heteroatoms;
noncontact atomic force microscopy;
organic chemistry;
real space;
ELECTRONIC-STRUCTURE CALCULATIONS;
MOLECULE;
BOND;
D O I:
10.1002/smll.202102977
中图分类号:
O6 [化学];
学科分类号:
0703 ;
摘要:
Immense strides have been made in increasing the resolution of scanning probe microscopy. Noncontact atomic force microscopy (nc-AFM) now offers one the ability to characterize and visualize single molecules with subatomic resolution. Specifically, nc-AFM with a carbon monoxide (CO) functionalized tip has the ability to discriminate functional groups (-C(sic)C-, -CH2, -C(sic)O, horizontal ellipsis ), although discriminating atomic species often remains as an ongoing challenge. Here, real-space pseudopotentials constructed within density functional theory are employed to accurately simulate nc-AFM images of molecules containing heteroatoms (S, I, and N) within dibenzothiophene (DBT), 2-iodotriphenylene (ITP), acridine (ACR) and ferrous phthalocyanine (FePc). It is found that S and I atoms can be easily identified from C based on their unique features. For N atoms, a use of tip functionalization is proposed to effectively discriminate them from C atoms.
机构:
Bilkent Univ, Dept Mech Engn, TR-06800 Ankara, Turkey
Bilkent Univ, UNAM Inst Mat Sci & Nanotechnol, TR-06800 Ankara, TurkeyBilkent Univ, Dept Mech Engn, TR-06800 Ankara, Turkey
Baykara, Mehmet Z.
Schwarz, Udo D.
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机构:
Yale Univ, Dept Mech Engn & Mat Sci, POB 208284, New Haven, CT 06520 USA
Yale Univ, Dept Chem & Environm Engn, POB 208284, New Haven, CT 06520 USA
Yale Univ, CRISP, POB 208284, New Haven, CT 06520 USABilkent Univ, Dept Mech Engn, TR-06800 Ankara, Turkey
Schwarz, Udo D.
BEILSTEIN JOURNAL OF NANOTECHNOLOGY,
2016,
7
: 946
-
947
机构:Seoul Natl Univ, Ctr Near Field Atom Photon Technol, Seoul 151747, South Korea
Seo, Y
Choe, H
论文数: 0引用数: 0
h-index: 0
机构:Seoul Natl Univ, Ctr Near Field Atom Photon Technol, Seoul 151747, South Korea
Choe, H
Jhe, W
论文数: 0引用数: 0
h-index: 0
机构:
Seoul Natl Univ, Ctr Near Field Atom Photon Technol, Seoul 151747, South KoreaSeoul Natl Univ, Ctr Near Field Atom Photon Technol, Seoul 151747, South Korea