Characterization of the Cyclostationary Emissions in the Near-Field of Electronic Device

被引：0

作者：

Kuznetsov, Y. ^{[1
]}

Baev, A. ^{[1
]}

Konovalyuk, M. ^{[1
]}

Gorbunova, A. ^{[1
]}

Haider, M. ^{[2
]}

Russer, J. A. ^{[2
]}

Russer, P. ^{[2
]}

机构：

[1] Natl Res Univ, Moscow Aviat Inst, Theoret Radio Engn Dept, Moscow, Russia

[2] Tech Univ Munich, Inst Nanoelect, Munich, Germany

来源：

2018 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC EUROPE) | 2018年

基金：

欧盟地平线“2020”;

关键词：

stochastic processes; correlation; electromagnetic interference; magnetic field measurement; time-domain analysis; electromagnetic compatibility; PROPAGATION;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper a methodology for the characterization of cyclostationary sources based on near-field time-domain measurements is proposed. The theory of the near-field scanning measurements over the equivalent Huygens' surface in parallel to the object plane of the PCB is presented. The theoretical background for the properties and characterization of the cyclostationary random processes is given. The space-time distributions of the cyclostationary sources over the equivalent Huygens surface of Intel Galileo Board is experimentally determined.

引用

页码：573 / 578

页数：6

共 15 条

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