共 11 条
[3]
DC APPROACH FOR ANALOG FAULT DICTIONARY DETERMINATION
[J].
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS,
1979, 26 (07)
:523-529
[4]
SRAM transparent testing methodology using dynamic power supply current
[J].
IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS,
2001, 148 (04)
:217-222
[5]
Dynamic power supply current testing of CMOS SRAMs
[J].
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,
2000, 16 (05)
:499-511
[7]
Papakostas D. K., 2004, ELECT LETT, V40
[8]
Spinks S. J., 2006, IEE P-CIRC DEV SYST, V143, P399