Measuring the Thermal Conductivity of Porous, Transparent SiO2 Films With Time Domain Thermoreflectance

被引:49
作者
Hopkins, Patrick E. [1 ]
Kaehr, Bryan [1 ,2 ]
Phinney, Leslie M. [1 ]
Koehler, Timothy P. [1 ]
Grillet, Anne M. [1 ]
Dunphy, Darren [2 ]
Garcia, Fred [2 ]
Brinker, C. Jeffrey [1 ,2 ]
机构
[1] Sandia Natl Labs, Engn Sci Ctr, Albuquerque, NM 87185 USA
[2] Univ New Mexico, Dept Chem & Nucl Engn, Albuquerque, NM 87106 USA
来源
JOURNAL OF HEAT TRANSFER-TRANSACTIONS OF THE ASME | 2011年 / 133卷 / 06期
关键词
time domain thermoreflectance; thermal conductivity; differential-effective medium theory; porous SiO2; PICOSECOND LIGHT-PULSES; 3-OMEGA METHOD; SILICON FILMS; GENERATION;
D O I
10.1115/1.4003548
中图分类号
O414.1 [热力学];
学科分类号
摘要
Nanocomposites offer unique capabilities of controlling thermal transport through the manipulation of various structural aspects of the material. However, measurements of the thermal properties of these composites are often difficult, especially porous nanomaterials. Optical measurements of these properties, although ideal due to the noncontact nature, are challenging due to the large surface variability of nanoporous structures. In this work, we use a vector-based thermal algorithm to solve for the temperature change and heat transfer in which a thin film subjected to a modulated heat source is sandwiched between two thermally conductive pathways. We validate our solution with time domain thermoreflectance measurements on glass slides and extend the thermal conductivity measurements to SiO2-based nanostructured films. [DOI: 10.1115/1.4003548]
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页数:8
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