Charge Transfer and Nanostructure Formation During Electroless Etching of Silicon

被引:43
作者
Kolasinski, Kurt W. [1 ]
机构
[1] W Chester Univ, Dept Chem, W Chester, PA 19383 USA
关键词
SITU INFRARED CHARACTERIZATION; DIVERSE FLUORIDE SOLUTIONS; SELF-OSCILLATING DOMAINS; LASER-ASSISTED FORMATION; FLAT H-SI(111) SURFACES; OPEN-CIRCUIT DEPOSITION; SINGLE-CRYSTAL SILICON; N-TYPE SILICON; POROUS-SILICON; HF/HNO3; MIXTURES;
D O I
10.1021/jp108169b
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The Turner mechanism of porous silicon formation during stain etching was developed and accepted without surface-sensitive data and without an understanding that nanostructures are being formed. Here it is shown that an oxide intermediate does not play a role in the formation of nanocrystalline porous Si films. Furthermore, a mechanistic understanding of etching and nanostructure formation leads to the formulation of seven rules for the rational design of stain etchants. These rules are used to develop three new formulations of stain etchants containing Fe(3+), VO(2)(+), and Ce(4+), which are demonstrated to effectively produce porous silicon. These new formulations represent a significant advance in stain etching as they avoid many of the problems associated with common nitrate-/nitrite-based stain etchants including no need for "activation", short induction times, and the reproducible production of homogeneous films of unprecedented thickness.
引用
收藏
页码:22098 / 22105
页数:8
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