Bipolar and unipolar resistive switching behaviors of sol-gel-derived SrTiO3 thin films with different compliance currents

被引:39
|
作者
Tang, M. H. [1 ]
Wang, Z. P. [1 ]
Li, J. C. [2 ]
Zeng, Z. Q. [1 ]
Xu, X. L. [1 ]
Wang, G. Y. [1 ]
Zhang, L. B. [1 ]
Xiao, Y. G. [1 ]
Yang, S. B. [1 ]
Jiang, B. [1 ]
He, J. [3 ]
机构
[1] Xiangtan Univ, Minist Educ, Key Lab Low Dimens Mat & Applicat Technol, Xiangtan 411105, Hunan, Peoples R China
[2] Natl Univ Def Technol, ASIC R&D Ctr, Sch Elect Sci & Engn, Changsha 410073, Hunan, Peoples R China
[3] Geol Survey Canada, Pacific Geosci Ctr, Sidney, BC V8L 4B2, Canada
基金
中国国家自然科学基金;
关键词
NONVOLATILE MEMORY; RESISTANCE; TRANSITION; INSULATOR; LAYER;
D O I
10.1088/0268-1242/26/7/075019
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The SrTiO3 (STO) thin films on a Pt/Ti/SiO2/Si substrate were synthesized using a sol-gel method to form a metal-insulator-metal structure. This device shows the bipolar resistance switching (BRS) behavior for a compliance current I-cc of less than 0.1 mA but exhibits soft breakdown at a higher level of compliance current. A transition from the BRS behavior to the stable unipolar resistive switching behavior (URS) was also observed. We found that the BRS behavior may be controlled by the structure interface while the URS behavior is likely bulk controlled. Our study indicates that the external compliance current is a key factor in resistance switching phenomenon of STO thin films.
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页数:4
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