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Polarized XAFS study on the ultrathin Pt/Co/Pt trilayers modified with short light pulses
被引:3
作者:
Wolska, A.
[1
]
Sobierajski, R.
[1
]
Klinger, D.
[1
]
Klepka, M. T.
[1
]
Jacyna, I.
[1
]
Wawro, A.
[1
]
Jakubowski, M.
[1
]
Kisielewski, J.
[2
]
Kurant, Z.
[2
]
Sveklo, I.
[2
]
Bartnik, A.
[3
]
Maziewski, A.
[2
]
机构:
[1] Polish Acad Sci, Inst Phys, Aleja Lotnikow 32-46, PL-02668 Warsaw, Poland
[2] Univ Bialystok, Fac Phys, Ciolkowskiego 1L, PL-15245 Bialystok, Poland
[3] Mil Univ Technol, Inst Optoelect, Kaliskiego 2, PL-00908 Warsaw, Poland
来源:
关键词:
Synchrotron radiation;
Polarized XAFS;
Perpendicular magnetization;
Thin layers;
FILMS;
D O I:
10.1016/j.nimb.2017.02.028
中图分类号:
TH7 [仪器、仪表];
学科分类号:
0804 ;
080401 ;
081102 ;
摘要:
Pt/Co/Pt trilayers irradiated with light pulses of different characteristics and showing the out-of-plane magnetization were investigated by means of the polarized X-ray absorption fine structure technique. The results of studies revealed that the irradiation introduces Co-Pt intermixing and strain in the layers. The Co-Pt alloys composition in the irradiated layer was found to be correlated with the magnetization remanence. (C) 2017 Elsevier B.V. All rights reserved.
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页码:112 / 115
页数:4
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