On the kinetics of the formation of interstitial Fe-vacancy pairs in silicon at high temperatures

被引:11
作者
Gunnlaugsson, HP
Weyer, G [1 ]
Christensen, NE
Dietrich, M
Fanciulli, M
Bharuth-Ram, K
Sielemann, R
Svane, A
机构
[1] Aarhus Univ, Dept Phys & Astron, DK-8000 Aarhus C, Denmark
[2] CERN, Div EP, CH-1211 Geneva 23, Switzerland
[3] INFM, Lab MDM, I-20041 Agrate Brianza, Italy
[4] Univ KwaZulu Natal, Sch Pure & Appl Phys, ZA-4041 Durban, South Africa
[5] Hahn Meitner Inst Berlin GmbH, D-14109 Berlin, Germany
关键词
Fe defects; vacancy; silicon; mossbauer spectroscopy;
D O I
10.1016/j.physb.2003.09.141
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Radioactive Mn-57(+) ions (T-1/2 = 1.5 min) of 60 keV energy have been implanted to low fluences into silicon crystals held at temperatures of 470-820 K. Most of the implantation damage is annealed during the Mn-57 lifetime and the Mn-57 atoms are incorporated on substitutional sites. Interstitial Fe (Fe-i) and a vacancy are created at these temperatures by the recoil in the nuclear decay of the substitutional Mn-57 atoms to the Mossbauer state (T-1/2 = 100 ns) of the Fe-57m daughter atoms. The formation of Fe-i-V pairs during the lifetime of the state has been observed by Mossbauer spectroscopy; the temperature-dependent kinetics of the process is consistent with the known Fei diffusion activation energies and not with those for vacancies. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:532 / 536
页数:5
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