Characterization of LaF3 coatings prepared at different temperatures and rates

被引:31
作者
Yu, Hua [1 ,2 ]
Shen, Yanming [1 ,2 ]
Cui, Yun [1 ,2 ]
Qi, Hongji [1 ]
Shao, JianDa [1 ]
Fan, ZhengXiu [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China
[2] Grad Univ, Chinese Acad Sci, Beijing 100049, Peoples R China
基金
中国国家自然科学基金;
关键词
LaF3; film; substrate temperature; deposition rate; LIDT;
D O I
10.1016/j.apsusc.2007.07.143
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
LaF3 thin films were prepared by thermal boat evaporation at different substrate temperatures and various deposition rates. X-ray diffraction (XRD), Lambda 900 spectrophotometer and X-ray photoelectron spectroscopy (XPS) were employed to study crystal structure, transmittance and chemical composition of the coatings, respectively. Laser-induce damage threshold (LIDT) was determined by a tripled Nd:YAG laser system with a pulse width of 8 ns. It is found that the crystal structure became more perfect and the refractive index increased gradually with the temperature rising. The LIDT was comparatively high at high temperature. In the other hand, the crystallization status also became better and the refractive index increased when the deposition rate enhanced at a low level. If the rate was super rapid, the crystallization worsened instead and the refractive index would lessen greatly. On the whole, the LIDT decreased with increasing rate. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:1783 / 1788
页数:6
相关论文
共 17 条
[1]  
Cullity B.D., 1978, ELEMENTS XRAY DIFFRA, V2nd, P102
[2]   Thin films laser damage mechanisms at the YAG third harmonic [J].
Dijon, J ;
Hue, J ;
Disgecmez, A ;
Quesnel, E ;
Rolland, B .
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1995: 27TH ANNUAL BOULDER DAMAGE SYMPOSIUM, PROCEEDINGS, 1996, 2714 :416-425
[3]   Laser conditioning of LaF3/MgF2 dielectric coatings at 248 nm [J].
Eva, E ;
Mann, K ;
Kaiser, N ;
Anton, B ;
Henking, R ;
Ristau, D ;
Weissbrodt, P ;
Mademann, D ;
Raupach, L ;
Hacker, E .
APPLIED OPTICS, 1996, 35 (28) :5613-5619
[4]   OPTICAL PROPERTIES OF CADMIUM SULFIDE AND ZINC SULFIDE FROM 0.6-MICRON TO 14-MICRONS [J].
HALL, JF ;
FERGUSON, WFC .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1955, 45 (09) :714-718
[5]  
*ISO, 2000, 1125412000 ISO
[6]  
IZAWA T, 1992, P SOC PHOTO-OPT INS, V1848, P322
[7]   HIGH DAMAGE THRESHOLD AL2O3/SIO2 DIELECTRIC COATINGS FOR EXCIMER LASERS [J].
KAISER, N ;
UHLIG, H ;
SCHALLENBERG, UB ;
ANTON, B ;
KAISER, U ;
MANN, K ;
EVA, E .
THIN SOLID FILMS, 1995, 260 (01) :86-92
[8]  
KOLBE J, 1992, P SOC PHOTO-OPT INS, V1624, P1
[9]  
Kolbe J, 1989, P SOC PHOTO-OPT INS, V1438, P404
[10]  
Lingg L. J., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V818, P86