New theoretical analysis of the LRRM calibration technique for vector network analyzers

被引：50

作者：

Purroy, F ^{[1
]}

Pradell, L

机构：

[1] Ericsson Radio Access AB, Kista, Sweden

[2] UPC, Dept TSC, Barcelona, Catalunya, Spain

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2001年 / 50卷 / 05期

关键词：

calibration algorithms; calibration standards; calibration techniques; network-analyzer; on-wafer calibration; reference impedance; self-calibration;

D O I：

10.1109/19.963202

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, a new theoretical analysis of the four-standards line-reflect-reflect-match (LRRM) vector network-analyzer (VNA) calibration technique is presented. As a result, it is shown that the reference-impedance (to which the LRRM calibration is referred) cannot generally be defined whenever nonideal standards are used. Based on this consideration, a new algorithm to determine the on-wafer match standard is proposed that improves the LRRM calibration accuracy. Experimental verification of the new theory and algorithm using on-wafer calibrations up to 40 GHz is given.

引用

页码：1307 / 1314

页数：8

共 14 条

[1]

Davidson A., 1990, 36th ARFTG Conference Digest. Fall 1990. Automatic RF Techniques Group, P57, DOI 10.1109/ARFTG.1990.323996

[2] THRU-REFLECT-LINE - IMPROVED TECHNIQUE FOR CALIBRATING THE DUAL 6-PORT AUTOMATIC NETWORK ANALYZER [J].