Two-color two-step laser ionization spectroscopy of uranium sputtered from thin metallic films

被引：0

作者：

Vandeweert, E ^{[1
]}

Philipsen, V ^{[1
]}

Lievens, P ^{[1
]}

Silverans, RE ^{[1
]}

Grüning, C ^{[1
]}

Miserque, F ^{[1
]}

Betti, M ^{[1
]}

Gouder, T ^{[1
]}

Erdmann, N ^{[1
]}

机构：

[1] Katholieke Univ Leuven, Vaste Stof Fys Magnetisme Lab, B-3001 Louvain, Belgium

来源：

RESONANCE IONIZATION SPECTROSCOPY 2000 | 2001年 / 584卷

关键词：

D O I：

暂无

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Resonance ionization mass spectrometry (RIMS) was used to obtain state selective information on uranium atoms released from thin films by keV ion beam bombardment. First experiments were conducted to evaluate double-resonant laser ionization schemes. The high selectivity of such ionization schemes is further illustrated by comparing the flight-time distributions of the sputtered particles obtained both by resonant and non-resonant multiphoton (355 nm) laser post-ionization.

引用

页码：305 / 308

页数：4

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