Effect of Chamber Pressure on Red Emission from Silicon thin films Deposited by means of Hot-Wire CVD

被引：0

作者：

Dutt, A. ^{[1
]}

Matsumoto, Y. ^{[1
]}

Ortega, M. ^{[1
]}

Sanchez, V. ^{[1
]}

Olvera, M. L. ^{[1
]}

机构：

[1] Ctr Invest & Estudios Avanzados IPN, Dept Ingn Elect, Av IPN 2508, Mexico City 07360, DF, Mexico

来源：

2015 12TH INTERNATIONAL CONFERENCE ON ELECTRICAL ENGINEERING, COMPUTING SCIENCE AND AUTOMATIC CONTROL (CCE 2015) | 2015年

关键词：

HW-CVD; nc-Si; Pressure; Visible PL; QUANTUM CONFINEMENT; SI; LUMINESCENCE; TEMPERATURE; NANOCRYSTALS; DOTS;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

nanocrystalline silicon (nc-Si) embedded in amorphous silicon oxide (a-SiOx) films were prepared by hot wire chemical vapor deposition (HW-CVD), also known as catalytic CVD (Cat-CVD) method. In this study, Tungsten (W) filament material was employed for decomposing the source gases in the reaction chamber. Effect of chamber pressure on the phase transition in silicon oxide (SiOx) has been studied by using X-Ray diffraction (XRD) and Raman spectroscopy techniques. A relationship between phase transition of thin film and Si-H bonding has been recognized and explained by using Fourier transform infrared (FTIR) spectroscopy. The samples deposited at low substrate temperature of 200 degrees C, has shown photoluminescence spectra in the red region and emission of spectra has been found to be in correlation with the size of nc-Si and/or defects present in the thin film.

引用

页数：6

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