Interconnect sizing and spacing with consideration of coupling capacitance

被引:31
作者
Cong, J [1 ]
He, L
Koh, CK
Pan, Z
机构
[1] Univ Calif Los Angeles, Dept Comp Sci, Los Angeles, CA 90095 USA
[2] Univ Wisconsin, Dept Elect & Comp Engn, Madison, WI 53706 USA
[3] Purdue Univ, Dept Elect & Comp Engn, W Lafayette, IN 47907 USA
[4] IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
基金
美国国家科学基金会;
关键词
coupling capacitance; interconnect; wire sizing; wire spacing;
D O I
10.1109/43.945311
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper studies interconnect sizing and spacing (ISS) problem with consideration of coupling capacitance for performance optimization of single or multiple critical nets. We introduce the formulation of symmetric and asymmetric wire sizing. We develop efficient bound computation algorithms for ISS optimization and prove their optimality under general interconnect resistance and capacitance models. Our experiments show that our algorithms are very effective and obtain significant performance improvement compared to previous wire-sizing/spacing algorithms.
引用
收藏
页码:1164 / 1169
页数:6
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