Ultra-small angle X-ray scattering to detect fatigue damage in polymers

被引：6

作者：

Baker, DA ^{[1
]}

Pruitt, L

Bellare, A

机构：

[1] Univ Calif Berkeley, Dept Mech Engn, Berkeley, CA 94720 USA

[2] Univ Calif Berkeley, Dept Bioengn, Berkeley, CA 94720 USA

[3] Harvard Univ, Sch Med, Dept Orthoped Surg, Cambridge, MA 02138 USA

来源：

JOURNAL OF MATERIALS SCIENCE LETTERS | 2001年 / 20卷 / 12期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1023/A:1010969029904

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The use of USAXS as a tool for the detection of fatigue flaws and cyclic damage is demonstrated. For this purpose, an ultrahigh molecular weight polyethylene (UHMWPE) sample is considered. Fatigue progression in this sample is monitored both quantitatively and over a larger size range.

引用

页码：1163 / 1164

页数：2

共 6 条

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