Cumulative shear strain-induced preferential orientation during abnormal grain growth near fatigue crack tips of nanocrystalline Au films

被引:15
作者
Zheng, Si-Xue [1 ,2 ]
Luo, Xue-Mei [1 ]
Zhang, Guang-Ping [1 ]
机构
[1] Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China
[2] Univ Sci & Technol China, Sch Mat Sci & Engn, Shenyang 110016, Peoples R China
基金
中国国家自然科学基金;
关键词
fatigue; grain size; texture; nanocrystalline; grain growth; MECHANICAL-PROPERTIES; DEFORMATION-BEHAVIOR; BOUNDARY MOTION; LENGTH-SCALE; COPPER; ROTATION; NANOINDENTATION; PLASTICITY; INITIATION; EVOLUTION;
D O I
10.1557/jmr.2019.409
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A detailed electron backscatter diffraction (EBSD) characterization was utilized to investigate abnormal grain growth behavior of nanocrystalline (NC) Au films constrained by a flexible substrate under cyclic loading. Abnormally grown grains (AGGs) in front of about 15 fatigue cracks were picked out to investigate the grain reorientation behavior during abnormal grain growth in the fatigue crack tip in the cyclically deformed thin films. It shows that the AGGs exhibited 001 orientation along the loading direction, whereas grains grown far away from fatigue cracks had no significant texture change. The cyclic cumulative shear strain was found to play a key role in grain reorientation. A lattice rotation model was proposed to elucidate the grain reorientation mechanism during abnormal grain growth. Such grain reorientation behavior of NC metals was found to provide an intrinsic resistance of the NC metals to fatigue damage.
引用
收藏
页码:372 / 379
页数:8
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