Conductivity, morphology, interfacial chemistry, and stability of poly(3,4-ethylene dioxythiophene)-poly(styrene sulfonate): A photoelectron spectroscopy study

被引：487

作者：

Crispin, X ^{[1
]}

Marciniak, S

Osikowicz, W

Zotti, G

Van der Gon, AWD

Louwet, F

Fahlman, M

Groenendaal, L

De Schryver, F

Salaneck, WR

机构：

[1] Linkoping Univ, Dept Phys & Measurement Technol, S-58183 Linkoping, Sweden

[2] Inst Consiglio Nazl Ric Energet & Interfasi, Co Stati Uniti 4, I-35127 Padua, Italy

[3] Eindhoven Univ Technol, Fac Appl Phys, NL-5600 MB Eindhoven, Netherlands

[4] Agfa Gevaert NV, R&D Mat Res, Dept Chem, B-2640 Mortsel, Belgium

[5] Linkoping Univ, Dept Sci & Technol, S-60174 Norrkoping, Sweden

[6] Katholieke Univ Leuven, Afdeling Fotochem & Spect, B-3001 Heverlee, Belgium

来源：

JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS | 2003年 / 41卷 / 21期

关键词：

ESCA/XPS; poly(3,4-ethylene dioxythiophene); conductivity; degradation; interfacial chemistry; conducting polymers;

D O I：

10.1002/polb.10659

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

X-ray photoelectron spectroscopy (XPS) has been used to characterize poly(3,4-ethylene dioxythiophene)-poly(styrene sulfonate) (PEDT/PSS), one of the most common electrically conducting organic polymers. A correlation has been established between the composition, morphology, and polymerization mechanism, on the one hand, and the electric conductivity of PEDT/PSS, on the other hand. XPS has been used to identify interfacial reactions occurring at the polymer-on-ITO and polymer-on-glass interfaces, as well as chemical changes within the polymer blend induced by electrical stress and exposure to ultraviolet light. (C) 2003 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 41: 2561-2583, 2003

引用

页码：2561 / 2583

页数：23

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