Unusual luminescence lines in GaN

被引:56
作者
Reshchikov, MA
Huang, D
Yun, F
Visconti, P
He, L
Morkoç, H
Jasinski, J
Liliental-Weber, Z
Molnar, RJ
Park, SS
Lee, KY
机构
[1] Virginia Commonwealth Univ, Dept Elect Engn, Richmond, VA 23284 USA
[2] Virginia Commonwealth Univ, Dept Phys, Richmond, VA 23284 USA
[3] Univ Calif Berkeley, Lawrence Berkeley Lab, Berkeley, CA 94720 USA
[4] MIT, Lincoln Lab, Lexington, MA 02420 USA
[5] Samsung Adv Inst Technol, Suwon 440600, South Korea
[6] CNR, Inst Studio Nuovi Mat Elettron, I-73100 Lecce, Italy
关键词
D O I
10.1063/1.1609632
中图分类号
O59 [应用物理学];
学科分类号
摘要
A series of sharp intense peaks was observed in the low-temperature photoluminescence spectrum of unintentionally doped GaN in the photon energy range between 3.0 and 3.46 eV. We attributed the majority of these peaks to excitons bound to unidentified structural and surface defects. Most of the structural- and surface-related peaks (at 3.21, 3.32, 3.34, 3.35, 3.38, and 3.42 eV) were observed in Ga polar films. In N polar GaN, we often observed the 3.45 eV peak attributed to excitons bound to the inversion domain interfaces. (C) 2003 American Institute of Physics.
引用
收藏
页码:5623 / 5632
页数:10
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