Kink-free design of submicrometer MRAM cell

被引:11
作者
Lee, KJ [1 ]
Park, W
Kim, T
机构
[1] Samsung Adv Inst Technol, Storage Lab, Suwon, South Korea
[2] Samsung Adv Inst Technol, Mat & Device Lab, Suwon, South Korea
关键词
kink; magnetoresistive random access memory (MRAM); micromagnetic simulation; selectivity;
D O I
10.1109/TMAG.2003.816240
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Full, miromagetic simulations have been performed to investigate the origin of a kink in a magnetoresistive curve and to design a kink-fme magnetoresistive random access memory (MRAM) cell. The kink in an at-field curve can originate from the, 2pi-wall or the vortex formation, which is strongly dependent on the magnetic properties. and the, geometry of a free layer. The kink originating from the 2pi-wall formation was found to disappear in a remanent magnetization curve; therefore, it should not affect the selectivity of a MRAM array. It turned out that the vortex formation-was the major origin of the kink when the free layer has the high saturation magnetization and the thick layer thickness. This vortex state is a local minimum in state even after removing the external field. Finally, we found kink-free criteria for various saturation magnetizations, thicknesses, and aspect ratios of a free layer.
引用
收藏
页码:2842 / 2844
页数:3
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