Fano factor determination for CZT

被引：22

作者：

Redus, RH ^{[1
]}

Pantazis, JA ^{[1
]}

Huber, AC ^{[1
]}

Jordanov, VT ^{[1
]}

Butler, JF ^{[1
]}

Apotovsky, B ^{[1
]}

机构：

[1] Amptek Inc, Bedford, MA USA

来源：

SEMICONDUCTORS FOR ROOM-TEMPERATURE RADIATION DETECTOR APPLICATIONS II | 1997年 / 487卷

关键词：

D O I：

10.1557/PROC-487-101

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Continued improvements in the manufacturing of Cd1-xZnxTe (CZT) material have resulted in a practical thermoelectrically cooled X-ray and gamma-ray detector of very high energy resolution. A high resolution spectroscopy system was used to measure the Fano factor in CZT at temperatures down to -40 degrees C. The best resolution of the 5.9 keV Fe-55 peak was measured to be 188 eV FWHM, while the best resolution of the 59.5 keV Am-241 peak was measured to be 482 eV FWHM. The minimum measured Fano factor was 0.082, with several measurements yielding a value of 0.089+/-0.005. With a resolution of 4.2 keV FWHM for the 662 keV peak of Cs-137, these detectors demonstrate excellent performance in detecting X-rays and gamma rays.

引用

页码：101 / 107

页数：7